Title :
Advanced Compact MOS Modelling
Author :
van Langevelde, R. ; Scholten, A.J. ; Havens, R.J. ; Tiemeijer, L.F. ; Klaassen, D.B.M.
Author_Institution :
Philips Research Laboratories, The Netherlands
fDate :
11-13 September 2001
Keywords :
CMOS process; CMOS technology; Capacitance; Integrated circuit modeling; Integrated circuit technology; Laboratories; MOSFETs; Radio frequency; Semiconductor device modeling; Smoothing methods;
Conference_Titel :
Solid-State Device Research Conference, 2001. Proceeding of the 31st European
Print_ISBN :
2-914601-01-8
DOI :
10.1109/ESSDERC.2001.195208
