Title :
Surrounding Gate Select Transistor for 4F2 Stacked Gbit DRAM
Author :
Hofmann, F. ; Rösner, W.
Author_Institution :
Infineon Technologies, Munich, Germany
fDate :
11-13 September 2001
Keywords :
Random access memory;
Conference_Titel :
Solid-State Device Research Conference, 2001. Proceeding of the 31st European
Print_ISBN :
2-914601-01-8
DOI :
10.1109/ESSDERC.2001.195218
