• DocumentCode
    1970343
  • Title

    Reuse of existing resources for analog BIST of a switch capacitor filter

  • Author

    Cota, Erika ; Carro, Luigi ; Renovell, Michel ; Lubaszewski, Marcelo ; Azaïs, Florence ; Bertrand, Yves

  • Author_Institution
    DELET, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    226
  • Lastpage
    230
  • Abstract
    The objective of this paper is to discuss the possibility of reusing the existing hardware originally present in an analog application to implement test functions for a completely autonomous self-testable solution. In this first approach, a 8th order analog linear filter is used as an application example. The required modifications in the circuit are presented with the results in terms of area overhead and fault coverage
  • Keywords
    analogue integrated circuits; built-in self test; integrated circuit testing; switched capacitor filters; SC filter; analog BIST; analog linear filter; area overhead; fault coverage; resources reuse; switched capacitor filter; test functions; Automatic testing; Built-in self-test; Capacitors; Circuit faults; Circuit testing; Hardware; Nonlinear filters; Signal generators; Switches; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-7695-0537-6
  • Type

    conf

  • DOI
    10.1109/DATE.2000.840043
  • Filename
    840043
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1970343