DocumentCode :
1970448
Title :
A comparative study of via drilling and scribing on PEN and PET substrates for flexible electronic applications using excimer and Nd:YAG laser sources
Author :
Mandamparambil, Rajesh ; Fledderus, Henri ; Van den Brand, Jeroen ; Saalmink, Milan ; Kusters, Roel ; Podprocky, Tomas ; Steenberge, Geert Van ; Baets, Johan De ; Dietzel, Andreas
Author_Institution :
Holst Centre/TNO, Eindhoven
fYear :
2009
fDate :
2-5 Feb. 2009
Firstpage :
1
Lastpage :
7
Abstract :
A study on via drilling and channel scribing on PEN and PET substrates for flexible electronic application is discussed in this paper. For the experiments, both KrF excimer laser (248 nm) and frequency tripled Nd:YAG (355 nm) laser are used. Different measurement techniques like optical microscopy, Dektak profilometer, Confocal microscopy and scanning electron microscopy (SEM) were employed to characterize the quality of the channels and vias. The patterned structures were filled by three different methods using a conductive paste or ink that is cured in an oven at an elevated temperature. The cross-sectional measurements of channels and vias were carried out using SEM to study the uniformity of filling.
Keywords :
drilling; excimer lasers; excimers; flexible electronics; Dektak profilometer; KrF; PEN substrates; PET substrates; channel scribing; conductive paste; confocal microscopy; cross-sectional measurements; elevated temperature; excimer; flexible electronic applications; ink; laser sources; optical microscopy; scanning electron microscopy; via drilling; Drilling; Electron optics; Flexible electronics; Frequency; Ink; Measurement techniques; Optical harmonic generation; Optical microscopy; Positron emission tomography; Scanning electron microscopy; Ablation; channels; flexible electronics; laser; vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Flexible Electronics & Displays Conference and Exhibition, 2009.
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-4338-3
Electronic_ISBN :
978-1-4244-4340-6
Type :
conf
DOI :
10.1109/FEDC.2009.5069273
Filename :
5069273
Link To Document :
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