Title :
Critical Study of the Saturation Drain Voltage and the Multiplication Current in MOSFETs at Liquid Helium Temperature
Author :
Simoen, E. ; Claeys, C.
Author_Institution :
IMEC, Leuven, Belgium
fDate :
11-13 September 2001
Keywords :
CMOS technology; Circuits; Cryogenics; Data mining; Helium; Immune system; MOSFETs; Semiconductor device modeling; Temperature; Threshold voltage;
Conference_Titel :
Solid-State Device Research Conference, 2001. Proceeding of the 31st European
Print_ISBN :
2-914601-01-8
DOI :
10.1109/ESSDERC.2001.195234
