Title :
2D analysis of gate polydepletion in ultra short MOSFETs
Author :
Josse, E. ; Skotnicki, T.
Author_Institution :
STMicroelectronics, Crolles, France
fDate :
11-13 September 2001
Conference_Titel :
Solid-State Device Research Conference, 2001. Proceeding of the 31st European
Print_ISBN :
2-914601-01-8
DOI :
10.1109/ESSDERC.2001.195237
