DocumentCode :
1970683
Title :
Compact modeling of nonlinear distortion in analog communication circuits
Author :
Wambacq, Piet ; Dobrovolny, Petr ; Donnay, Stéphane ; Engels, Marc ; Bolsens, Ivo
Author_Institution :
IMEC, Leuven, Belgium
fYear :
2000
fDate :
2000
Firstpage :
350
Lastpage :
354
Abstract :
The design of analog front-ends of digital telecommunication transceivers requires simulations at the architectural level. The nonlinear nature of the analog front-end blocks is a complication for their modeling at the architectural level, especially when the nonlinear behavior is frequency dependent. This paper describes a method to derive a bottom-up model of nonlinear analog continuous-time circuits used in communication systems. The models take into account frequency dependence of the nonlinear behavior, making them suitable for wideband applications. Such model consists of a block diagram that corresponds to the most important contributions to the second- and third-order Volterra kernels of the output quantity (voltage or current) of a circuit. The examples in this paper, a high-level model of a CMOS low-noise amplifier and an active lowpass filter, demonstrate that the generated models can be efficiently evaluated in high-level dataflow-type simulations of mixed-signal front-ends and that they yield insight in the nonlinear behavior of the analog front-end blocks
Keywords :
active filters; analogue integrated circuits; circuit simulation; continuous time systems; integrated circuit modelling; nonlinear distortion; nonlinear network analysis; radiofrequency amplifiers; transceivers; CMOS LNA; active lowpass filter; analog front-ends; analogue communication circuits; architectural level simulation; bottom-up model; compact modeling; dataflow-type simulations; digital telecommunication transceivers; frequency dependence; high-level model; low-noise amplifier; nonlinear behavior; nonlinear continuous-time circuits; nonlinear distortion; second-order Volterra kernel; third-order Volterra kernel; wideband applications; Active filters; Circuit simulation; Frequency dependence; Kernel; Low-noise amplifiers; Nonlinear distortion; Semiconductor device modeling; Transceivers; Voltage; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-0537-6
Type :
conf
DOI :
10.1109/DATE.2000.840295
Filename :
840295
Link To Document :
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