• DocumentCode
    1970771
  • Title

    Automatic test bench generation for validation of RT-level descriptions: an industrial experience

  • Author

    Corno, F. ; Sonza Reorda, M. ; Squillero, G. ; Manzone, A. ; Pincetti, A.

  • Author_Institution
    Dipt. di Autom. e Inf., Politecnico di Torino, Italy
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    385
  • Lastpage
    389
  • Abstract
    In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis with designers working exclusively at the RT-level, and design productivity is greatly enhanced. However, in the new design flow, validation still remains a challenge: while new technologies based on formal verification are only marginally accepted, standard techniques based on simulation are beginning to fall behind the increased circuit complexity. This paper proposes a new approach to simulation-based validation, in which a genetic algorithm helps the designer in generating useful input sequences to be included in the test bench. The technique has been applied to an industrial circuit, showing that the quality of the validation process is increased
  • Keywords
    automatic test pattern generation; circuit simulation; genetic algorithms; logic testing; RT-level description validation; automatic test bench generation; genetic algorithm; simulation-based validation; Algorithm design and analysis; Automatic testing; Circuit simulation; Circuit synthesis; Complexity theory; Formal verification; Genetic algorithms; Microprocessors; Productivity; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-7695-0537-6
  • Type

    conf

  • DOI
    10.1109/DATE.2000.840300
  • Filename
    840300