DocumentCode :
1970771
Title :
Automatic test bench generation for validation of RT-level descriptions: an industrial experience
Author :
Corno, F. ; Sonza Reorda, M. ; Squillero, G. ; Manzone, A. ; Pincetti, A.
Author_Institution :
Dipt. di Autom. e Inf., Politecnico di Torino, Italy
fYear :
2000
fDate :
2000
Firstpage :
385
Lastpage :
389
Abstract :
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis with designers working exclusively at the RT-level, and design productivity is greatly enhanced. However, in the new design flow, validation still remains a challenge: while new technologies based on formal verification are only marginally accepted, standard techniques based on simulation are beginning to fall behind the increased circuit complexity. This paper proposes a new approach to simulation-based validation, in which a genetic algorithm helps the designer in generating useful input sequences to be included in the test bench. The technique has been applied to an industrial circuit, showing that the quality of the validation process is increased
Keywords :
automatic test pattern generation; circuit simulation; genetic algorithms; logic testing; RT-level description validation; automatic test bench generation; genetic algorithm; simulation-based validation; Algorithm design and analysis; Automatic testing; Circuit simulation; Circuit synthesis; Complexity theory; Formal verification; Genetic algorithms; Microprocessors; Productivity; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-0537-6
Type :
conf
DOI :
10.1109/DATE.2000.840300
Filename :
840300
Link To Document :
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