Title :
Stigmatic imaging mass spectrometry using a multi-turn time-of-flight mass spectrometer
Author :
Hazama, Hisanao ; Aoki, Jun ; Nagao, Hirofumi ; Yoshimura, Hidetoshi ; Naito, Yasuhide ; Toyoda, Michisato ; Masuda, Katsuyoshi ; Fujii, Kenichi ; Tashima, Toshio ; Awazu, Kunio
Author_Institution :
Grad. Sch. of Eng., Osaka Univ., Suita, Japan
Abstract :
A stigmatic imaging mass spectrometer using a multi-turn time-of-flight mass spectrometer, MULTUM-IMG, has been developed. The ion images were maintained after 10 cycles in MULTUM-IMG and a mass resolving power of 14000 was achieved.
Keywords :
time of flight mass spectrometers; MULTUM-IMG; ion images; multi-turn time-of-flight mass spectrometer; stigmatic imaging mass spectrometry; Circuits; Drugs; Focusing; Image resolution; Ion sources; Ionization; Lenses; Mass spectroscopy; Molecular biophysics; Spatial resolution; Delay-line detector; Imaging Mass Spectrometry; Matrix-Assisted Laser Desorption/Ionization; Mid-infrared tunable laser; Multi-Turn Time-of Flight Mass Spectrometer;
Conference_Titel :
Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics, 2009. CLEO/PACIFIC RIM '09. Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3829-7
Electronic_ISBN :
978-1-4244-3830-3
DOI :
10.1109/CLEOPR.2009.5292164
