DocumentCode
1970867
Title
RF/wireless interconnects in future on-chip and board-level clock distribution network
Author
Roy, Abinash ; Chowdhury, Masud H.
Author_Institution
Univ. of Illinois at Chicago, Chicago
fYear
2007
fDate
17-20 May 2007
Firstpage
542
Lastpage
545
Abstract
With operating frequencies in GHz regime, problems associated with digital systems in terms of clock skew, jitter, power consumption, bit error rate (BER), and signal integrity are becoming critical in on-chip/off-chip clock distribution networks using conventional copper interconnect technology, which has emerged as a performance limiter for current and future VLSI circuits. In order to mitigate these rising problems and maintain the continuous improvement of high speed integrated circuits, different alternative approaches such as 3-D interconnect, RF/wireless interconnect and optical interconnect have currently been investigated. This paper presents an overview of the limitations of conventional clock distribution networks, and investigates the feasibility and challenges of adopting RF/wireless interconnects in future on-chip and board-level clock distribution networks. Exploratory research results show that these new interconnect technologies will offer desired performances for future high speed clock distribution network operating in multi GHz frequencies if design and integration challenges can be resolved. Based on the survey among the available alternatives, RF/wireless interconnect seems to be the most viable candidate to replace copper interconnect in near future technology nodes (up to 20 GHz).
Keywords
VLSI; clocks; system-on-chip; VLSI circuits; bit error rate; board-level clock distribution network; conventional copper interconnect technology; high speed integrated circuits; on-chip/off-chip clock distribution networks; signal integrity; Bit error rate; Clocks; Copper; Digital systems; Energy consumption; Integrated circuit interconnections; Jitter; Network-on-a-chip; Power system interconnection; Radio frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Electro/Information Technology, 2007 IEEE International Conference on
Conference_Location
Chicago, IL
Print_ISBN
978-1-4244-0941-9
Electronic_ISBN
978-1-4244-0941-9
Type
conf
DOI
10.1109/EIT.2007.4374479
Filename
4374479
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