Title :
Explanation of IGBT Tail Current Oscillations by a Novel "Plasma Extraction Transit Time" Mechanism
Author :
Gutsmann, Bernd ; Silber, Dieter ; Mourick, Paul
Author_Institution :
University of Bremen, Germany
fDate :
11-13 September 2001
Keywords :
Current measurement; Diodes; Frequency; Insulated gate bipolar transistors; Metallization; Multichip modules; Plasma measurements; Resonance; Tail; Voltage measurement;
Conference_Titel :
Solid-State Device Research Conference, 2001. Proceeding of the 31st European
Print_ISBN :
2-914601-01-8
DOI :
10.1109/ESSDERC.2001.195249
