• DocumentCode
    1970978
  • Title

    Single step current driven routing of multiterminal signal nets for analog applications

  • Author

    Adler, Thorsten ; Barke, Erich

  • Author_Institution
    Infineon Technol. AG, Germany
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    446
  • Lastpage
    450
  • Abstract
    We present the single layer router CDR (Current Driven Router) capable of routing analog multiterminal signal nets with current driven wire widths. The widths used during routing are determined by current properties per terminal gained by simulation or manually specified by circuit designers. The algorithm presented computes a Steiner tree layout satisfying all specified current constraints while obeying the maximum allowed current densities on all connections. CDR calculates the Steiner tree topology, computes the unknown currents of wires connecting two Steiner points and generates the final Steiner tree layout in a single step thus eliminating the need for a separate layout post-processing step common to power and ground routing algorithms. CDR uses a connection graph for layout representation and applies an advanced minimum detour algorithm in combination with a modified `three-point steinerization´ heuristic for Steiner tree based layout construction
  • Keywords
    analogue integrated circuits; circuit layout CAD; current density; integrated circuit layout; multiterminal networks; network routing; network topology; trees (mathematics); Steiner tree layout; advanced minimum detour algorithm; analog multiterminal signal nets; connection graph; current densities; current driven wire widths; layout representation; path finding algorithm; single step current driven routing; three-point steinerization heuristic; Analog circuits; Circuit topology; Current density; Digital circuits; Integrated circuit interconnections; Joining processes; National electric code; Power generation; Routing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-7695-0537-6
  • Type

    conf

  • DOI
    10.1109/DATE.2000.840309
  • Filename
    840309