Title : 
2-D Passive Millimeter Wave Imaging System for Plasma Diagnostics
         
        
            Author : 
Shen, Zuowei ; Domier, C.W. ; Luhmann, N.C., Jr. ; Ito, N. ; Mase, A. ; Donne, A.J.H. ; Park, H.K.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., UC Davis, Davis, CA
         
        
        
        
        
        
            Abstract : 
Technology advances have made possible the visualization of electron temperature profiles and fluctuations inside the core of high temperature plasmas via a two-dimensional passive millimeter wave imaging system. The electron cyclotron emission imaging (ECEI) system concept and configuration are briefly described. Advanced technologies such as frequency selective surfaces band-stop filter, planar Schottky diode mixer arrays, wide bandwidth IF electronics, and imaging optics are presented.
         
        
            Keywords : 
Schottky diode mixers; band-stop filters; cyclotrons; frequency selective surfaces; millimetre wave filters; millimetre wave imaging; millimetre wave mixers; plasma diagnostics; plasma fluctuations; plasma temperature; 2-D passive millimeter wave imaging system; ECEI system; electron cyclotron emission imaging; electron temperature profiles; frequency selective surfaces band-stop filter; high-temperature plasmas; planar Schottky diode mixer arrays; plasma diagnostics; plasma fluctuation; wide bandwidth IF electronics; Electrons; Fluctuations; Millimeter wave technology; Optical arrays; Optical filters; Optical imaging; Plasma diagnostics; Plasma temperature; Plasma waves; Visualization; IF electronics; dual dipole antenna array; electron cyclotron emission imaging (ECEI); frequency selective surface (FSS); notch filter; passive millimeter wave imaging;
         
        
        
        
            Conference_Titel : 
Microwave Conference, 2007. APMC 2007. Asia-Pacific
         
        
            Conference_Location : 
Bangkok
         
        
            Print_ISBN : 
978-1-4244-0748-4
         
        
            Electronic_ISBN : 
978-1-4244-0749-1
         
        
        
            DOI : 
10.1109/APMC.2007.4554553