Title :
Improvement of coexisting signal detection for MB-OFDM system
Author :
Ohno, Kohei ; Itami, Makoto ; Ikegami, Tetsushi
Author_Institution :
Dept. of Appl. Electron., Tokyo Univ. of Sci., Noda, Japan
Abstract :
This paper discusses coexisting signal detection technique of the interference DAA (Detect And Avoid) operation. In this paper, the emission of the coexisting singles and their occupied frequency band detection technique for the MB-OFDM (Multi-Band OFDM) system is proposed in order to improve the DER (miss Detection Error Rate) and the FAR (False Alarm Rate). The received coexisting signal is assumed to be the sum of the sinusoidal waves. The sinusoidal signal is detected and it is subtracted from the received signal iteratively to minimize the evaluation function. The frequency, phase and amplitude of the sinusoidal signals are estimated using the evaluation function and the Newton method. Obtained amplitude coefficients are combined per the bandwidth and the results are compared with the threshold to detect coexisting signal having wider bandwidth than FFT bin. The DER and FAR are evaluated to show the effectiveness of the proposed detection technique. The performances of the proposed detection scheme are improved comparing to the ordinary scheme using FFT.
Keywords :
Newton method; OFDM modulation; cognitive radio; radiofrequency interference; signal detection; DER; FAR; FFT bin; MB-OFDM system; Newton method; cognitive radio; detect and avoid operation; evaluation function minimization; false alarm rate; frequency band detection technique; interference DAA operation; miss detection error rate; multiband OFDM system; received coexisting signal; signal detection technique; sinusoidal signal detection; sinusoidal wave; Bandwidth; Frequency estimation; Newton method; Noise; OFDM; Signal detection; WiMAX; Cognitive Radio; Evaluation Function; Interference Detect and Avoid; Multi Bband-OFDM; Newton Method;
Conference_Titel :
Ultra-Wideband (ICUWB), 2012 IEEE International Conference on
Conference_Location :
Syracuse, NY
Print_ISBN :
978-1-4577-2031-4
DOI :
10.1109/ICUWB.2012.6340484