Title :
Simultaneous refractive indices and thicknesses measurements in non-live materials using optical coherence tomography
Author :
Lee, Byeong Ha ; Choi, Woo June ; Na, Jihoon
Author_Institution :
Dept. of Inf. & Commun., Gwangju Inst. of Sci. & Technol. (GIST), Gwangju, South Korea
Abstract :
The refractive index and the physical thickness of an optical substance have been measured simultaneously with the interferometry based on optical coherence tomography. Full-field OCT and Fourier domain OCT are utilized to measure various samples including a solid droplet, thin film, plate, liquid, and even gaseous sample.
Keywords :
Fourier analysis; Fourier transform optics; light interferometry; optical tomography; refractive index measurement; thickness measurement; Fourier domain OCT; full-field OCT; gaseous sample; interferometry based OCT; liquid; nonlive sample materials; optical coherence tomography; optical substance; physical thickness measurement; plate; refractive index measurement; solid droplet; thin film; Optical films; Optical interferometry; Optical materials; Optical refraction; Optical variables control; Refractive index; Solids; Thickness measurement; Tomography; Transistors; Optical coherence tomography; physical thickness; refractive index; simultaneous measurement;
Conference_Titel :
Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics, 2009. CLEO/PACIFIC RIM '09. Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3829-7
Electronic_ISBN :
978-1-4244-3830-3
DOI :
10.1109/CLEOPR.2009.5292184
