Title :
Modeling Lateral Parasitic Structures of Multiterminal Devices in Smart-Power Technologies
Author :
Zorzi, Marco ; Speciale, Nicolò
Author_Institution :
University of Bologna, Italy
fDate :
11-13 September 2001
Keywords :
Circuit testing; Geometry; Insulation; Integrated circuit technology; MOSFETs; Parameter extraction; Predictive models; Solid modeling; Substrates; Topology;
Conference_Titel :
Solid-State Device Research Conference, 2001. Proceeding of the 31st European
Print_ISBN :
2-914601-01-8
DOI :
10.1109/ESSDERC.2001.195262
