DocumentCode :
1971407
Title :
Component level risk assessment in Grids: A probablistic risk model and experimentation
Author :
Sangrasi, Asif ; Djemame, Karim
Author_Institution :
Sch. of Comput., Univ. of Leeds, Leeds, UK
fYear :
2011
fDate :
May 31 2011-June 3 2011
Firstpage :
68
Lastpage :
75
Abstract :
The current approaches to manage risk in Grid computing are a major step towards the provision of Quality of Service (QoS) to the end-user. However these approaches are based on node or machine level Assessment. As a node may contain CPU(s), storage devices, connections for communication and software resource, a node failure may actually be a failure of any of these components. This paper proposes a probabilistic risk model at the component level; the probabilistic risk model encompasses series and parallel model(s). Our approach towards risk assessment is aimed at a granularity level of individual components as compared to previous efforts at node level. The benefits of this probabilistic approach is the provision of a detailed risk assessment to the Grid resource provider leading to risk aware scheduling and an efficient usage of resources. Grid failure data was analyzed and experimentation was conducted based the proposed risk model. The results of the experiments provide detailed risk information at component level for the nodes required in the SLA (Service Level Agreement).
Keywords :
grid computing; personal computing; probability; quality of service; risk analysis; scheduling; system recovery; CPU; SLA; component level risk assessment; end user; grid computing; machine level assessment; node failure; parallel model; probabilistic risk model; quality of service; risk management; service level agreement; software resource; Computational modeling; Data models; Probabilistic logic; Quality of service; Risk management; Software; Weibull distribution; Grid computing; failure data; probablity of failure; risk; risk assessment; risk model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital Ecosystems and Technologies Conference (DEST), 2011 Proceedings of the 5th IEEE International Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4577-0871-8
Type :
conf
DOI :
10.1109/DEST.2011.5936600
Filename :
5936600
Link To Document :
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