مرکز منطقه ای اطلاع رساني علوم و فناوري - An experimental approach for bias-dependent drain series resistances evaluation in asymmetric HV MOSFETs

DocumentCode :

1971524

Title :

An experimental approach for bias-dependent drain series resistances evaluation in asymmetric HV MOSFETs

Author :

Hefyene, N. ; Anghel, C. ; Ionescu, A.M. ; Frere, S. ; Gillon, R. ; Vermandel, M. ; Bakeroot, B. ; Doutreloigne, J.

Author_Institution :

EPFL, Lausanne, Switzerland

fYear :

2001

fDate :

11-13 September 2001

Firstpage :

403

Lastpage :

406

Keywords :

MOSFETs;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Solid-State Device Research Conference, 2001. Proceeding of the 31st European

Print_ISBN :

2-914601-01-8

Type :

conf

DOI :

10.1109/ESSDERC.2001.195286

Filename :

1506668

Link To Document :