Title :
Analysis of the stress-optical effects in silica-on-silicon optical waveguides
Author :
Lang, Tingting ; Kuang, Jingguo ; Lin, Xufeng
Author_Institution :
Coll. of Opt. & Electron. Technol., China Jiliang Univ., Hangzhou, China
Abstract :
Stress-induced birefringence in silica-on-silicon waveguides is analyzed by the finite element method using the normalized plane strain model. The simulation results show that the thermal expansion coefficient of the upper-cladding is the most critical factor. A waveguide with zero birefringence is obtained and used to realize polarization independent AWGs.
Keywords :
birefringence; elemental semiconductors; finite element analysis; optical waveguides; piezo-optical effects; silicon; silicon compounds; thermal expansion; SiO2-Si; finite element method; normalized plane strain model; optical waveguides; polarization independent AWG; stress optical effects; stress-induced birefringence; thermal expansion coefficient; upper cladding; Optical device fabrication; Optical fibers; Optical polarization; Strain; Stress;
Conference_Titel :
Communications and Photonics Conference and Exhibition (ACP), 2010 Asia
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-7111-9
DOI :
10.1109/ACP.2010.5682752
