DocumentCode :
1971940
Title :
Keynote address: Will reliability limit Moore´s law?
Author :
Oates, Tony
Author_Institution :
TSMC 168 Park Avenue 2, Hsinchu Science Park, 30844, Hsinchu, Taiwan
fYear :
2013
fDate :
13-17 Oct. 2013
Abstract :
Moore´s law continues to be the engine of growth for the global electronics industry. The understanding of IC degradation mechanisms has resulted in rapid reliability improvements that have enabled the rapid rate technology progression we have experienced. Going forward it is clear that the reliability margins the industry has enjoyed in the past will shrink. The question is now whether reliability will pose a constraint on Moore´s law. In this talk we will discuss reliability issues that can most directly impact the industry´s capability to maintain the pace of technology progression required by Moore´s law.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International
Conference_Location :
South Lake Tahoe, CA, USA
ISSN :
1930-8841
Print_ISBN :
978-1-4799-0350-4
Type :
conf
DOI :
10.1109/IIRW.2013.6804135
Filename :
6804135
Link To Document :
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