DocumentCode :
1972153
Title :
Numerical analyses of all-optical gate switches using cascaded second-order nonlinear effect in periodically poled lithium niobate devices: Effects of device fabrication errors
Author :
Fukuchi, Yutaka ; Tasaki, Shun
Author_Institution :
Dept. of Electr. Eng., Tokyo Univ. of Sci., Tokyo, Japan
fYear :
2010
fDate :
8-12 Dec. 2010
Firstpage :
172
Lastpage :
173
Abstract :
We numerically calculate the switching performance of all-optical ultra-fast gate switches employing the cascade of second harmonic generation and difference frequency mixing in periodically poled lithium niobate devices. In the analyses, the device fabrication errors are considered. We show that the domain length error decreases the switching efficiency significantly.
Keywords :
high-speed optical techniques; lithium compounds; optical fabrication; optical harmonic generation; optical switches; LiNbO3; all-optical gate switches; cascaded second-order nonlinear effect; device fabrication errors; difference frequency mixing; domain length error; periodically poled devices; second harmonic generation; switching efficiency; ultrafast gate switches; Crosstalk; Fabrication; Lithium niobate; Logic gates; Optical switches; Performance evaluation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications and Photonics Conference and Exhibition (ACP), 2010 Asia
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-7111-9
Type :
conf
DOI :
10.1109/ACP.2010.5682778
Filename :
5682778
Link To Document :
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