• DocumentCode
    1972303
  • Title

    Growth of n-doped GaAs nanowires by Au-assisted metalorganic chemical vapor deposition: Effect of n-type dopants flux rates

  • Author

    Guo, Jingwei ; Huang, Hui ; Liu, Minjia ; Ren, Xiaomin ; Cai, Shiwei ; Wang, Qi ; Qi Wang ; Huang, Yongqing ; Zhang, Xia

  • Author_Institution
    Key Lab. of Inf. Photonics & Opt. Commun. Minist. of Educ., Beijing Univ. of Posts & Telecommun., Beijing, China
  • fYear
    2010
  • fDate
    8-12 Dec. 2010
  • Firstpage
    156
  • Lastpage
    157
  • Abstract
    Three samples of GaAs NWs grown with different n-type dopants flux rates were researched. From SEM figures, we can find that all NWs are vertical to the substrate and no lateral growth occurs. The growth rate is proportional the flux rates of n-type dopant SiH4. Larger SiH4 flux rate results in larger growth rate of NWs. For n-doped NWs, their growth were affected by Gibbs-Thomson effect, which is that NWs with larger diameters grow faster than those with smaller diameters. For all samples, the contribution from adatom diffusion can be negligible and almost all contribution comes from catalytic pyrolysis of the precursors impinging on the NPs. From TEM images, pure zinc blende structures without any stacking faults from bottom to top for all three samples were achieved. This study on n-doped GaAs NWs have many potential applications for nano-electronic and nano-optoelectronic devices.
  • Keywords
    III-V semiconductors; MOCVD; diffusion; gallium arsenide; gold; metallic thin films; nanoparticles; nanowires; pyrolysis; scanning electron microscopy; semiconductor doping; semiconductor growth; transmission electron microscopy; Au; GaAs; GaAs:Jk; Gibbs-Thomson effect; SEM; TEM; adatom diffusion; catalytic pyrolysis; metalorganic chemical vapor deposition:; n-type dopants; nanowire growth; stacking faults; zinc blende structures; Gallium arsenide; Gold; Nanoscale devices; Scanning electron microscopy; Stacking; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications and Photonics Conference and Exhibition (ACP), 2010 Asia
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-7111-9
  • Type

    conf

  • DOI
    10.1109/ACP.2010.5682786
  • Filename
    5682786