DocumentCode
1972303
Title
Growth of n-doped GaAs nanowires by Au-assisted metalorganic chemical vapor deposition: Effect of n-type dopants flux rates
Author
Guo, Jingwei ; Huang, Hui ; Liu, Minjia ; Ren, Xiaomin ; Cai, Shiwei ; Wang, Qi ; Qi Wang ; Huang, Yongqing ; Zhang, Xia
Author_Institution
Key Lab. of Inf. Photonics & Opt. Commun. Minist. of Educ., Beijing Univ. of Posts & Telecommun., Beijing, China
fYear
2010
fDate
8-12 Dec. 2010
Firstpage
156
Lastpage
157
Abstract
Three samples of GaAs NWs grown with different n-type dopants flux rates were researched. From SEM figures, we can find that all NWs are vertical to the substrate and no lateral growth occurs. The growth rate is proportional the flux rates of n-type dopant SiH4. Larger SiH4 flux rate results in larger growth rate of NWs. For n-doped NWs, their growth were affected by Gibbs-Thomson effect, which is that NWs with larger diameters grow faster than those with smaller diameters. For all samples, the contribution from adatom diffusion can be negligible and almost all contribution comes from catalytic pyrolysis of the precursors impinging on the NPs. From TEM images, pure zinc blende structures without any stacking faults from bottom to top for all three samples were achieved. This study on n-doped GaAs NWs have many potential applications for nano-electronic and nano-optoelectronic devices.
Keywords
III-V semiconductors; MOCVD; diffusion; gallium arsenide; gold; metallic thin films; nanoparticles; nanowires; pyrolysis; scanning electron microscopy; semiconductor doping; semiconductor growth; transmission electron microscopy; Au; GaAs; GaAs:Jk; Gibbs-Thomson effect; SEM; TEM; adatom diffusion; catalytic pyrolysis; metalorganic chemical vapor deposition:; n-type dopants; nanowire growth; stacking faults; zinc blende structures; Gallium arsenide; Gold; Nanoscale devices; Scanning electron microscopy; Stacking; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications and Photonics Conference and Exhibition (ACP), 2010 Asia
Conference_Location
Shanghai
Print_ISBN
978-1-4244-7111-9
Type
conf
DOI
10.1109/ACP.2010.5682786
Filename
5682786
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