• DocumentCode
    197263
  • Title

    Topological edge states in silicon photonics

  • Author

    Mittal, Sparsh ; Fan, Jintao ; Migdall, A. ; Taylor, J.M. ; Hafezi, M.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Univ. of Maryland, College Park, MD, USA
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We demonstrate the robustness of topological edge states in a photonic system of coupled microring resonators. Using direct imaging and transmission analysis, we show that the edge states are robust to lattice disorders.
  • Keywords
    elemental semiconductors; integrated optics; micro-optics; optical resonators; silicon; Si; coupled microring resonators; direct imaging; lattice disorders; silicon photonics; topological edge states; transmission analysis; Arrays; Image edge detection; Lattices; Optical ring resonators; Photonics; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2014 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    6989966
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=197263