Title :
Topological edge states in silicon photonics
Author :
Mittal, Sparsh ; Fan, Jintao ; Migdall, A. ; Taylor, J.M. ; Hafezi, M.
Author_Institution :
Nat. Inst. of Stand. & Technol., Univ. of Maryland, College Park, MD, USA
Abstract :
We demonstrate the robustness of topological edge states in a photonic system of coupled microring resonators. Using direct imaging and transmission analysis, we show that the edge states are robust to lattice disorders.
Keywords :
elemental semiconductors; integrated optics; micro-optics; optical resonators; silicon; Si; coupled microring resonators; direct imaging; lattice disorders; silicon photonics; topological edge states; transmission analysis; Arrays; Image edge detection; Lattices; Optical ring resonators; Photonics; Robustness;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
