Title :
Characterizing N-port packages and interconnections with a 2-port network analyzer
Author :
Sercu, Stefaan ; Martens, Luc
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Belgium
Abstract :
In this paper a technique is described for the measurement of the correct S-parameters of an N-port package or interconnection using a 2-port network analyzer with 50 /spl Omega/ system impedance and N imperfect terminations. The technique is fully general and can be applied using arbitrary terminations. Broadband 50 n loads are not required. The method is illustrated on a coupled microstrip line structure.
Keywords :
S-parameters; microstrip lines; multiport networks; network analysers; packaging; 50 ohm; N-port interconnections; N-port packages; S-parameters; arbitrary terminations; coupled microstrip line structure; imperfect terminations; system impedance; two-port network analyzer; Bandwidth; Frequency measurement; Information analysis; Information technology; Matrices; Packaging; Q measurement; Reflection; Scattering parameters; Tin;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1997., IEEE 6th Topical Meeting on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-8649-3
DOI :
10.1109/EPEP.1997.634062
