DocumentCode :
1973308
Title :
Design and implementation of an intelligent prognostics system
Author :
Su, Yu-chuan ; Cheng, Fan-tien ; Hung, Min-Hsiung ; Lin, Yen-Chang ; Lin, Rung-Chuan
Author_Institution :
Inst. of Manuf. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fYear :
2005
fDate :
1-2 Aug. 2005
Firstpage :
273
Lastpage :
278
Abstract :
This work proposes an intelligent prognostics system (IPS) for semiconductor and TFT-LCD manufacturing. The IPS comprises several generic embedded devices (GEDs) and a remote host. The GED can be easily embedded into various types of equipment to acquire equipment-engineering data and meet the specification requirements of interface A for supporting semiconductor industry e-diagnostics. Furthermore, the GED has an open-standard application interface offering any pluggable and customized intelligent-maintenance applications. With this feature, intelligent-maintenance tasks can be distributed and localized releasing the factory network burden and enhancing equipment reliability and maintainability. This work also develops two typical pluggable applications: the predictive maintenance scheme (PMS) for equipment fault detection, and the quality prognostics scheme (QPS) for virtual metrology and product quality prediction. Integrating the PMS into the IPS and the QPS into the IPS are respectively accomplished using the conveyor equipment and the sputtering equipment of a TFT-LCD factory. These two illustrative examples clearly demonstrate that IPS is versatile, configurable, and effective.
Keywords :
diagnostic expert systems; embedded systems; fault diagnosis; liquid crystal displays; maintenance engineering; semiconductor device manufacture; TFT-LCD manufacturing; equipment fault detection; generic embedded devices; intelligent prognostics system; interface A; predictive maintenance scheme; semiconductor industry e-diagnostics; semiconductor manufacturing; Electronics industry; Fault detection; Intelligent manufacturing systems; Intelligent networks; Intelligent systems; Metrology; Predictive maintenance; Production facilities; Semiconductor device manufacture; Sputtering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation Science and Engineering, 2005. IEEE International Conference on
Print_ISBN :
0-7803-9425-9
Type :
conf
DOI :
10.1109/COASE.2005.1506781
Filename :
1506781
Link To Document :
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