Title : 
Complementary field effect transistors for VLSI design on GaN and related alloys
         
        
            Author : 
Alexandrov, Dimiter
         
        
            Author_Institution : 
Dept. of Electr. Eng., Lakehead Univ., Thunder Bay, Ont., Canada
         
        
        
        
        
        
            Abstract : 
Newfound quasi-particles in InxGa1-xN called excitons of the structure are used as the basis for the design of complementary n-channel and p-channel field effect transistors in this paper. These complementary transistors are applicable for VLSI design. The transistors use excitons of the structure as both quantum electron source for n-channel and quantum hole source for p-channel. Both FET channels are designed on non-doped GaN. The design of the electron source of the n-channel and the design of the hole source of the p-channel are given. The designs of both FET structures are given as well. The corresponding voltage-current characteristics presenting the dependences of the drain currents on the voltages drain-source and on the gate voltages are given. The switching times of both field effect transistors (n-channel and p-channel) are determined.
         
        
            Keywords : 
III-V semiconductors; VLSI; excitons; field effect transistors; gallium alloys; indium alloys; integrated circuit design; nitrogen compounds; quasiparticles; switching; wide band gap semiconductors; GaN; InxGa1-xN; VLSI design; complementary field effect transistors; drain currents; excitons; gate voltages; n-channel transistors; p-channel transistors; quantum electron source; quantum hole source; quasiparticles; transistors switching times; very large-scale integration; voltage-current characteristics; voltages drain-source; Charge carrier processes; Electron sources; Excitons; FETs; Gallium nitride; Lakes; Microelectronics; Photonic band gap; Very large scale integration; Voltage;
         
        
        
        
            Conference_Titel : 
Electrical and Computer Engineering, 2003. IEEE CCECE 2003. Canadian Conference on
         
        
        
            Print_ISBN : 
0-7803-7781-8
         
        
        
            DOI : 
10.1109/CCECE.2003.1226403