• DocumentCode
    1973721
  • Title

    Outcomes-based program assessment: a practical approach

  • Author

    Stephanchick, Puul ; Karim, Asad

  • Author_Institution
    DeVry Inst. of Technol., Kansas City, MO, USA
  • Volume
    3
  • fYear
    1999
  • fDate
    10-13 Nov. 1999
  • Abstract
    ABET´s requirement for accredited programs to implement outcomes-based assessment models has stimulated the growth of formalized assessment programs within the engineering and engineering technology communities. This paper outlines the model that DeVry Institute of Technology (USA) is using to implement a complete assessment plan for its electronics engineering technology (EET) program. The program assessment plan contains the specifics of a structured process which validates that students are achieving the goals and objectives of the program via direct and indirect measurements. Information gathered from faculty, students, alumni and employers is used to measure the knowledge levels achieved and to determine skills and competencies. The number of measured objectives will increase and ultimately meet the TAC of ABET criteria. Student performance and retention data are closely monitored for improvements during the implementation of the assessment program. The goal is to employ a continuous assessment process that provides meaningful input to future program development and allows the institution to strengthen its educational effectiveness.
  • Keywords
    accreditation; educational courses; electronic engineering education; quality control; teaching; ABET criteria; USA; continuous assessment process; educational effectiveness; electronics engineering technology; outcomes-based program assessment; student performance; student retention; students; Application software; Education; Educational institutions; Electronic equipment testing; Hardware; Iron; Laboratories; Monitoring; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frontiers in Education Conference, 1999. FIE '99. 29th Annual
  • Conference_Location
    San Juan, Puerto Rico
  • ISSN
    0190-5848
  • Print_ISBN
    0-7803-5643-8
  • Type

    conf

  • DOI
    10.1109/FIE.1999.840449
  • Filename
    840449