Title :
Fifth power scaling of quality factor in silicon photonic degenerate band edge resonators
Author :
Burr, Justin R. ; Wood, Michael G. ; Reano, Ronald M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
Abstract :
We observe experimentally a transition of quality factor scaling from third power to fifth power of the number of periods in periodic silicon optical waveguides designed to exhibit a degenerate band edge.
Keywords :
Q-factor; elemental semiconductors; integrated optics; optical resonators; optical waveguides; silicon; Si; fifth power scaling; periodic silicon optical waveguides; quality factor scaling transition; silicon photonic degenerate band edge resonators; third power scaling; Optical device fabrication; Optical resonators; Optical surface waves; Optical waveguides; Periodic structures; Q-factor; Silicon;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
