A 10 μm resolution secondary emission monitor for Fermilab´s targeting station

Author

Hurh, P. ; Day, S.O. ; Dombrowski, R. ; Page, T.

Author_Institution

Fermi Nat. Accel. Lab., Batavia, IL, USA

fYear

1993

fDate

17-20 May 1993

Firstpage

2459

Abstract

Improvement in focusing the proton beam onto the antiproton production target necessitates the development of a higher resolution beam profile monitor. Two designs for the construction of a multiwire profile monitor grid are presented. The first is a conventional strung and tensioned Ti wire design. The second is a photo etched Ti grid of wires bonded to a ceramic substrate. Both have a central wire spacing of 125 μm. The completed beam profile monitors are designed to operate in a 120 GeV beam pulse of 5×10¹² protons with a 1.5 μs duration and will be installed in late 1993

Keywords

beam handling techniques; particle beam diagnostics; proton accelerators; 1.5 mus; 10 μm resolution secondary emission monitor; 10 mum; 120 GeV; 125 mum; Fermilab´s targeting station; Ti; antiproton production target; ceramic substrate; higher resolution beam profile monitor; multiwire profile monitor grid; photo etched Ti grid; proton beam focusing; strung tensioned Ti wire design; Etching; Heating; Laboratories; Monitoring; Particle beams; Production; Proton accelerators; Structural beams; Vacuum technology; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1993., Proceedings of the 1993

Conference_Location

Washington, DC

Print_ISBN

0-7803-1203-1

Type

conf

DOI

10.1109/PAC.1993.309355

Filename

309355