Title :
A 10 μm resolution secondary emission monitor for Fermilab´s targeting station
Author :
Hurh, P. ; Day, S.O. ; Dombrowski, R. ; Page, T.
Author_Institution :
Fermi Nat. Accel. Lab., Batavia, IL, USA
Abstract :
Improvement in focusing the proton beam onto the antiproton production target necessitates the development of a higher resolution beam profile monitor. Two designs for the construction of a multiwire profile monitor grid are presented. The first is a conventional strung and tensioned Ti wire design. The second is a photo etched Ti grid of wires bonded to a ceramic substrate. Both have a central wire spacing of 125 μm. The completed beam profile monitors are designed to operate in a 120 GeV beam pulse of 5×1012 protons with a 1.5 μs duration and will be installed in late 1993
Keywords :
beam handling techniques; particle beam diagnostics; proton accelerators; 1.5 mus; 10 μm resolution secondary emission monitor; 10 mum; 120 GeV; 125 mum; Fermilab´s targeting station; Ti; antiproton production target; ceramic substrate; higher resolution beam profile monitor; multiwire profile monitor grid; photo etched Ti grid; proton beam focusing; strung tensioned Ti wire design; Etching; Heating; Laboratories; Monitoring; Particle beams; Production; Proton accelerators; Structural beams; Vacuum technology; Wire;
Conference_Titel :
Particle Accelerator Conference, 1993., Proceedings of the 1993
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-1203-1
DOI :
10.1109/PAC.1993.309355
