Title :
Direct and Accurate Measurements of Mixer Equivalent Noise Temperatures
Author :
Nightingale, S. ; Schiek, B.
Author_Institution :
PFH, Philips Research Laboratories, Redhill, Surrey, England
Abstract :
A new measuring technique has been developed, which enables the effective noise temperature Teff and intrinsic conversion loss Li of a lossy 2-port network to be determined directly. This technique when applied to a mixer, yields results which are in agreement with theoretical predictions (0.5 ¿ Teff ¿ To; To ambient temperature) and may be measured with greater accuracy than has previously been possible using other methods. Practical results will be presented together with theoretical predictions based on a new approach to mixer noise analysis. This approach gives greater insight into the noise generation mechanisms and is more readily interpreted than other methods published to date in the literature.
Keywords :
Circuit noise; Loss measurement; Measurement techniques; Microwave frequencies; Mixers; Noise figure; Noise generators; Noise measurement; Schottky diodes; Temperature;
Conference_Titel :
Microwave Conference, 1978. 8th European
Conference_Location :
Paris, France
DOI :
10.1109/EUMA.1978.332620