Title :
Research on the behavior of Se-Te film in photoelectrical field
Author_Institution :
Shanghai Electr. Cable Res. Inst., China
Abstract :
Se-Te films with various ratios of Se and Te were prepared, and film aging with multiple charging-discharging cycles was studied. The effects of the film composition and the wavelength of the light on the electrophotographic sensitivity were observed. Film surface properties, investigated by Auger photoelectrical energy spectrometry, are discussed. The ratio Se:Te=0.48:0.52 by weight was found to be the best ratio for film sensitivity, and 700 nm was the most suitable wavelength.<>
Keywords :
ageing; electrophotography; selenium; tellurium; Auger photoelectrical energy spectrometry; Se-Te films; charging-discharging cycles; electrophotographic sensitivity; film aging; film surface properties; Aging; Chemicals; Corona; Crystalline materials; Photoconducting materials; Physics; Production; Raw materials; Spectroscopy; Tellurium;
Conference_Titel :
Industry Applications Society Annual Meeting, 1989., Conference Record of the 1989 IEEE
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/IAS.1989.96959
