• DocumentCode
    1974257
  • Title

    Circuit modeling of isolation in flip-chip microwave integrated circuits

  • Author

    Ito, Ryosuke ; Jackson, Robert W.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
  • fYear
    1997
  • fDate
    27-29 Oct. 1997
  • Firstpage
    217
  • Lastpage
    220
  • Abstract
    A circuit model for multi-port flipped-chip packaging of microwave integrated circuits is described. The model topology includes the effect of non-ideal isolation between IC ports and predicts resonance behavior in the millimeterwave range. Measurements of a scale model four port are used for verification.
  • Keywords
    MIMIC; flip-chip devices; integrated circuit modelling; integrated circuit packaging; multiport networks; IC ports; circuit model; flip-chip microwave integrated circuits; millimeterwave range; multi-port flipped-chip packaging; nonideal isolation; resonance behavior; scale model four port; Circuit simulation; Circuit testing; Circuit topology; Frequency; Integrated circuit measurements; Integrated circuit modeling; MMICs; Microwave integrated circuits; Packaging; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 1997., IEEE 6th Topical Meeting on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-8649-3
  • Type

    conf

  • DOI
    10.1109/EPEP.1997.634074
  • Filename
    634074