Title :
Tip-enhanced raman spectroscopic measurements in the sub-nanometric vicinity of a metallic tip
Author :
Verma, P. ; Ichimura, T. ; Yano, T. ; Saito, Y. ; Kawata, S.
Author_Institution :
Dept. of Appl. Phys., Osaka Univ., Suita, Japan
Abstract :
By developing a new time-gated technique, we demonstrate sub-nanometric control over the tip-sample distance in tip-enhanced Raman spectroscopy, which allows us to precisely control the chemical and mechanical effect and to realize super-high resolution imaging.
Keywords :
Raman spectroscopy; image resolution; chemical effects; mechanical effects; sub-nanometric control; super-high resolution imaging; tip-enhanced Raman spectroscopy; Atom optics; Atomic force microscopy; Chemicals; Optical diffraction; Optical imaging; Optical scattering; Optical surface waves; Plasmons; Raman scattering; Spectroscopy; Tip-enhanced Raman spectrsocopy;
Conference_Titel :
Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics, 2009. CLEO/PACIFIC RIM '09. Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3829-7
Electronic_ISBN :
978-1-4244-3830-3
DOI :
10.1109/CLEOPR.2009.5292328
