DocumentCode :
19745
Title :
MDS Product Code Performance Estimations Under Header CRC Check Failures and Missing Syncs
Author :
Arslan, Suayb S. ; Jaewook Lee ; Hodges, Jerry ; Peng, Junbiao ; Hoa Le ; Goker, Turguy
Author_Institution :
Adv. Dev. Lab., Quantum Corp., Irvine, CA, USA
Volume :
14
Issue :
3
fYear :
2014
fDate :
Sept. 2014
Firstpage :
921
Lastpage :
930
Abstract :
Data storage systems that use removable media heavily rely on strong concatenated error correction coding (ECC) architectures in order to guarantee very low target data loss rates. Particularly, tape drives and optical disk drives (e.g., CD, DVD, and BD) employ powerful ECC schemes based on a concatenation of an outer maximum distance separable (MDS) code called C2 and an inner MDS code called C1 in order to achieve this performance. In addition to data, these storage systems employ header and synchronization appends (i.e., sync patterns) for appropriate allocation of user information on the physical storage medium. Since headers and sync patterns are subject to channel errors as well, accurately retrieved data may be regarded useless if an error occurs in either of these fields. In order to predict very low target C2 failure rates (which is typically on the order of 10-17) in the presence of header and synchronization errors, we propose a semianalytical method in this paper that incorporates the effects of the header and synchronization errors in the output error rate expressions. We use our proposed model with linear tape open (LTO) data examples to both show the effectiveness of the estimation results and draw some interesting conclusions.
Keywords :
channel coding; concatenated codes; cyclic redundancy check codes; disc drives; error correction codes; linear codes; product codes; synchronisation; BD; CD; DVD; ECC architecture; LTO data; MDS product code performance estimation; concatenated error correction coding architecture; cyclic redundancy check code; data retrieval; data storage system; header CRC check failure; linear tape open data; maximum distance separable code; missing sync pattern; optical disk drive; output error rate expression; physical storage medium; semianalytical method; synchronization error; tape drive; Encoding; Error correction codes; Maximum likelihood decoding; Product codes; Reliability; Synchronization; Error-correcting codes; linear tape open (LTO); optical and magnetic recording; product codes; reliability;
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2014.2345585
Filename :
6874518
Link To Document :
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