DocumentCode :
1974564
Title :
Application of Inverted Strip Dielectric Waveguides for Measurement of Material Properties at Millimeter-Wave Frequencies
Author :
Itoh, Tatsuo ; Hsu, Fwu-Jih
Author_Institution :
Department of Electrical Engineering, The University of Texas, Austin, TX 78712
fYear :
1978
fDate :
4-8 Sept. 1978
Firstpage :
823
Lastpage :
827
Abstract :
An entirely new method for measuring dielectric properties of slab type materials is developed by using a novel dielectric waveguide structure originally designed for millimeter-wave integrated circuits. The method entails the measurement of the stop-band of the grating structure created in the dielectric waveguide. Several examples of measurement results are reported.
Keywords :
Dielectric materials; Dielectric measurements; Frequency measurement; Integrated circuit measurements; Material properties; Millimeter wave integrated circuits; Millimeter wave measurements; Millimeter wave technology; Slabs; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1978. 8th European
Conference_Location :
Paris, France
Type :
conf
DOI :
10.1109/EUMA.1978.332629
Filename :
4131309
Link To Document :
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