Title :
A self-calibration 103-dB SNR stereo audio DAC with true-GND class-D headphone drivers in 45nm CMOS
Author :
Lee, Yong-Hee ; Seok, Chun-Kyun ; Kim, Bong-Joo ; You, Seung-Bin ; Yeum, Wang-Seup ; Park, Ho-Jin ; Park, Byeong-Ha
Author_Institution :
Samsung Electron., Yongin, South Korea
Abstract :
A stereo audio DAC with ground-centered class-D headphone drivers is fully integrated in a 45nm CMOS technology. A built-in self-calibration is proposed to minimize DC offset voltage causing static power dissipation. The asymmetric averaging PWM is also applied to improve linearity and suppress switching noise and loss. The measured SNR and DR are 103dB and 98dB, respectively.
Keywords :
CMOS analogue integrated circuits; digital-analogue conversion; headphones; CMOS technology; DC offset voltage; SNR; asymmetric averaging PWM; built-in self-calibration; ground-centered class-D headphone driver; size 45 nm; static power dissipation; stereo audio DAC; switching noise; true-GND class-D headphone driver; Calibration; Driver circuits; Headphones; Pulse width modulation; Pulse width modulation converters; Signal to noise ratio; audio DAC; true-GND and asymmetric PWM;
Conference_Titel :
SoC Design Conference (ISOCC), 2010 International
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-8633-5
DOI :
10.1109/SOCDC.2010.5682904
