• DocumentCode
    1974609
  • Title

    CMOS image sensors-recent advances and device scaling considerations

  • Author

    Hon-Sum Philip Wong

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1997
  • fDate
    10-10 Dec. 1997
  • Firstpage
    201
  • Lastpage
    204
  • Abstract
    This paper reviews the industry trend and the recent advances in CMOS image sensor technology, covering advances in technology, devices, pixel architecture, as well as on-chip circuit integration. Compatibility with "standard" CMOS technology is an important consideration for CMOS image sensors. We therefore explore the question: "will the image sensing performance of CMOS imagers get better or get worse as CMOS technologies are scaled?" We project that "standard" CMOS technologies cannot be used for imaging in the deep sub-micron regime without some process modifications.
  • Keywords
    CMOS integrated circuits; image sensors; integrated circuit technology; CMOS image sensor technology; device scaling; on-chip circuit integration; pixel architecture; CMOS image sensors; CMOS logic circuits; CMOS process; CMOS technology; Charge coupled devices; Costs; Energy consumption; Image sensors; Low voltage; Pixel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-4100-7
  • Type

    conf

  • DOI
    10.1109/IEDM.1997.650332
  • Filename
    650332