DocumentCode :
1974609
Title :
CMOS image sensors-recent advances and device scaling considerations
Author :
Hon-Sum Philip Wong
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
1997
fDate :
10-10 Dec. 1997
Firstpage :
201
Lastpage :
204
Abstract :
This paper reviews the industry trend and the recent advances in CMOS image sensor technology, covering advances in technology, devices, pixel architecture, as well as on-chip circuit integration. Compatibility with "standard" CMOS technology is an important consideration for CMOS image sensors. We therefore explore the question: "will the image sensing performance of CMOS imagers get better or get worse as CMOS technologies are scaled?" We project that "standard" CMOS technologies cannot be used for imaging in the deep sub-micron regime without some process modifications.
Keywords :
CMOS integrated circuits; image sensors; integrated circuit technology; CMOS image sensor technology; device scaling; on-chip circuit integration; pixel architecture; CMOS image sensors; CMOS logic circuits; CMOS process; CMOS technology; Charge coupled devices; Costs; Energy consumption; Image sensors; Low voltage; Pixel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
Conference_Location :
Washington, DC, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-4100-7
Type :
conf
DOI :
10.1109/IEDM.1997.650332
Filename :
650332
Link To Document :
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