DocumentCode
1975248
Title
FiX-compact: A new X-tolerant response compaction scheme for fixed unknown logic values
Author
Park, Jaeseok ; Kang, Sungho
Author_Institution
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
fYear
2010
fDate
22-23 Nov. 2010
Firstpage
209
Lastpage
212
Abstract
This paper proposes a new X-tolerant response compaction scheme with a practical assumption where the unknown values are generated on fixed scan chains. The proposed scheme guarantees fault diagnosis and treats simultaneous unknown logic values. In addition, it requires simple compactor structure composed of XOR gates, and it does not need any additional signal from the outside.
Keywords
fault diagnosis; logic gates; logic testing; FiX-compact; X-tolerant response compaction scheme; XOR gates; fault diagnosis; fixed unknown logic value; Clocks; Compaction; Design automation; Equations; Hardware; Logic gates; Pins; Response compaction; X-tolerant;
fLanguage
English
Publisher
ieee
Conference_Titel
SoC Design Conference (ISOCC), 2010 International
Conference_Location
Seoul
Print_ISBN
978-1-4244-8633-5
Type
conf
DOI
10.1109/SOCDC.2010.5682936
Filename
5682936
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