Title :
FiX-compact: A new X-tolerant response compaction scheme for fixed unknown logic values
Author :
Park, Jaeseok ; Kang, Sungho
Author_Institution :
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
This paper proposes a new X-tolerant response compaction scheme with a practical assumption where the unknown values are generated on fixed scan chains. The proposed scheme guarantees fault diagnosis and treats simultaneous unknown logic values. In addition, it requires simple compactor structure composed of XOR gates, and it does not need any additional signal from the outside.
Keywords :
fault diagnosis; logic gates; logic testing; FiX-compact; X-tolerant response compaction scheme; XOR gates; fault diagnosis; fixed unknown logic value; Clocks; Compaction; Design automation; Equations; Hardware; Logic gates; Pins; Response compaction; X-tolerant;
Conference_Titel :
SoC Design Conference (ISOCC), 2010 International
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-8633-5
DOI :
10.1109/SOCDC.2010.5682936
