• DocumentCode
    1975404
  • Title

    Capacitive interpolated Flash ADC design technique

  • Author

    Tang, He ; Zhao, Hui ; Wang, Xin ; Lin, Lin ; Fang, Qiang ; Liu, Jian ; Wang, Albert ; Fan, Siqiang ; Zhao ; Zitao Shi ; Cheng, Yuhua

  • Author_Institution
    Dept. of EE, Univ. of California, Riverside, Riverside, CA, USA
  • fYear
    2010
  • fDate
    22-23 Nov. 2010
  • Firstpage
    166
  • Lastpage
    169
  • Abstract
    Analog-to-digital converter (ADC) is a key component electronic system. Flash ADC is widely used in high-speed systems. However, practical flash ADC design is very challenging where experience plays a significant role. ADC design involves in many factors at different levels including architecture, circuit, device and technology. This paper reports a quantitative design methodology for capacitive interpolated flash ADCs, which establishes a design matrix that links ADC chip performance with architecture, block circuit, devices and process parameters. Complex relationship among critical ADC specs, such as, sampling speed, interpolation factors, number of stages, preamplifier bandwidth and transistor parasitic effects, etc, are described. An accurate dynamic power analysis technique is depicted. This flash ADC design method was validated using several designs in 90 nm and 130 nm CMOS technologies.
  • Keywords
    CMOS digital integrated circuits; analogue-digital conversion; integrated circuit design; CMOS technology; analog-to-digital converter; block circuit; capacitive interpolated flash ADC design technique; component electronic system; design matrix; dynamic power analysis technique; high-speed systems; preamplifier bandwidth; quantitative design methodology; size 130 nm; size 90 nm; transistor parasitic effects; Bandwidth; CMOS integrated circuits; Capacitance; Capacitors; Interpolation; Performance evaluation; Power dissipation; CMOS; capacitive interpolation; flash ADC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SoC Design Conference (ISOCC), 2010 International
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-8633-5
  • Type

    conf

  • DOI
    10.1109/SOCDC.2010.5682945
  • Filename
    5682945