Title :
Noise performance of a color CMOS photogate image sensor
Author :
Blanksby, A.J. ; Loinaz, M.J. ; Inglis, D.A. ; Ackland, B.D.
Author_Institution :
Dept. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
Abstract :
We report on the noise performance of a color CMOS photogate image sensor that supports two levels of correlated double sampling and has high conversion gain at each pixel. Imager performance is limited by low quantum efficiency and dark current non-uniformity and not by read-out circuit temporal or fixed-pattern noise.
Keywords :
CMOS integrated circuits; image colour analysis; image sensors; integrated circuit noise; color CMOS photogate image sensor; correlated double sampling; dark current; fixed-pattern noise; pixel conversion gain; quantum efficiency; read-out circuit; temporal noise; CMOS image sensors; Circuit noise; Colored noise; Dark current; Image converters; Image sampling; Image sensors; Noise level; Performance gain; Pixel;
Conference_Titel :
Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-4100-7
DOI :
10.1109/IEDM.1997.650337
