DocumentCode :
19757
Title :
Follow-Up Multicenter Alpha Counting Comparison
Author :
Wilkinson, J.D. ; Clark, B.M. ; Wong, Rita ; Slayman, C. ; Gordon, Michael S. ; He, Yuhong ; Marckmann, J. ; McNally, B.D. ; Wu, Tsai-Fu
Author_Institution :
Medtronic Inc., Mounds View, MN, USA
Volume :
61
Issue :
4
fYear :
2014
fDate :
Aug. 2014
Firstpage :
1516
Lastpage :
1521
Abstract :
A follow-up alpha emissivity study was conducted to examine the wide variability observed in previous work that was hypothesized to be due to differences in the pulse height discrimination threshold among participant´s equipment. Two samples, one mixed energy and one monoenergetic, were prepared and sequentially circulated to all participants for counting. Analysis of the data demonstrates that only a small portion of the variability is explained by this mechanism. The role of the sample to entrance window gap for some counters was analyzed post hoc using the same data set and may be responsible for a large amount of the variability. The results of this large-scale study demonstrate the continuing uncertainty for these measurements and the importance of interpreting their results appropriately when estimating soft error rates.
Keywords :
alpha-particle detection; radiation hardening (electronics); alpha emissivity; entrance window gap; follow up multicenter alpha counting comparison; pulse height discrimination threshold; soft error rate; Alpha particles; Atmospheric measurements; Materials; Measurement uncertainty; Particle measurements; Radiation detectors; Uncertainty; Alpha particle; detectors; materials; reliability; single event upsets;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2014.2308956
Filename :
6820771
Link To Document :
بازگشت