Title :
UWB SoC co-design with ESD protection
Author :
Xin Wang ; Lin Lin ; He Tang ; Jian Liu ; Qiang Fang ; Hui Zhao ; Wang, Aiping ; Fan, S.Q. ; Guan, Xiangyu ; Zhao, Bin ; Zitao Shi ; Yuhua Cheng ; Bo Qin ; Li-Wu Yang
Author_Institution :
Dept. of EE, Univ. of California Riverside, Riverside, CA, USA
Abstract :
This paper discusses critical aspects for co-design of ultra wideband (UWB) system-on-chip (SoC) and on-chip electrostatic discharge (ESD) protection, which are beyond simple data rate and bandwidth considerations. UWB-ESD co-design techniques and experiment results are presented. The designs were implemented in a commercial 0.18 μm RFCMOS.
Keywords :
CMOS integrated circuits; electrostatic discharge; logic design; radiofrequency integrated circuits; system-on-chip; ultra wideband technology; ESD protection; RF CMOS; UWB SoC co-design; UWB-ESD co-design technique; on-chip electrostatic discharge; size 0.18 micron; ultra wideband system-on-chip; Degradation; Electrostatic discharge; Noise measurement; Receivers; System-on-a-chip; Transmission line measurements; Transmitters; ESD protection; UWB; UWB-ESD co-design;
Conference_Titel :
SoC Design Conference (ISOCC), 2010 International
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-8633-5
DOI :
10.1109/SOCDC.2010.5682986
