• DocumentCode
    1976318
  • Title

    Successive Refinement for Pattern Recognition

  • Author

    O´Sullivan, Joseph A. ; Singla, Naveen ; Westover, M. Brandon

  • Author_Institution
    Electronic Systems and Signals Research Laboratory, Department of Electrical & Systems Engineering, Washington University, St. Louis, MO 63130, USA, Email: jao@ese.wustl.edu
  • fYear
    2006
  • fDate
    13-17 March 2006
  • Firstpage
    141
  • Lastpage
    145
  • Abstract
    In this paper we examine the achievable rate region for the problem of successive refinement of information for pattern recognition systems. The pattern recognition system has two stages, going from coarse to fine recognition as more resources become available for storing internal representations of the patterns. We present an inner and an outer bound on the true achievable rate region. Using these results we derive conditions under which a pattern recognition system is successively refinable. These conditions are similar to the Markov condition for successive refinement in the rate-distortion problem.
  • Keywords
    Databases; Laboratories; Mathematical model; Pattern recognition; Probability distribution; Rate distortion theory; Rate-distortion; Systems engineering and theory; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Workshop, 2006. ITW '06 Punta del Este. IEEE
  • Conference_Location
    Punta del Este, Uruguay
  • Print_ISBN
    1-4244-0035-X
  • Electronic_ISBN
    1-4244-0036-8
  • Type

    conf

  • DOI
    10.1109/ITW.2006.1633798
  • Filename
    1633798