Title :
Successive Refinement for Pattern Recognition
Author :
O´Sullivan, Joseph A. ; Singla, Naveen ; Westover, M. Brandon
Author_Institution :
Electronic Systems and Signals Research Laboratory, Department of Electrical & Systems Engineering, Washington University, St. Louis, MO 63130, USA, Email: jao@ese.wustl.edu
Abstract :
In this paper we examine the achievable rate region for the problem of successive refinement of information for pattern recognition systems. The pattern recognition system has two stages, going from coarse to fine recognition as more resources become available for storing internal representations of the patterns. We present an inner and an outer bound on the true achievable rate region. Using these results we derive conditions under which a pattern recognition system is successively refinable. These conditions are similar to the Markov condition for successive refinement in the rate-distortion problem.
Keywords :
Databases; Laboratories; Mathematical model; Pattern recognition; Probability distribution; Rate distortion theory; Rate-distortion; Systems engineering and theory; Training data;
Conference_Titel :
Information Theory Workshop, 2006. ITW '06 Punta del Este. IEEE
Conference_Location :
Punta del Este, Uruguay
Print_ISBN :
1-4244-0035-X
Electronic_ISBN :
1-4244-0036-8
DOI :
10.1109/ITW.2006.1633798