DocumentCode
1976318
Title
Successive Refinement for Pattern Recognition
Author
O´Sullivan, Joseph A. ; Singla, Naveen ; Westover, M. Brandon
Author_Institution
Electronic Systems and Signals Research Laboratory, Department of Electrical & Systems Engineering, Washington University, St. Louis, MO 63130, USA, Email: jao@ese.wustl.edu
fYear
2006
fDate
13-17 March 2006
Firstpage
141
Lastpage
145
Abstract
In this paper we examine the achievable rate region for the problem of successive refinement of information for pattern recognition systems. The pattern recognition system has two stages, going from coarse to fine recognition as more resources become available for storing internal representations of the patterns. We present an inner and an outer bound on the true achievable rate region. Using these results we derive conditions under which a pattern recognition system is successively refinable. These conditions are similar to the Markov condition for successive refinement in the rate-distortion problem.
Keywords
Databases; Laboratories; Mathematical model; Pattern recognition; Probability distribution; Rate distortion theory; Rate-distortion; Systems engineering and theory; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory Workshop, 2006. ITW '06 Punta del Este. IEEE
Conference_Location
Punta del Este, Uruguay
Print_ISBN
1-4244-0035-X
Electronic_ISBN
1-4244-0036-8
Type
conf
DOI
10.1109/ITW.2006.1633798
Filename
1633798
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