DocumentCode :
1976405
Title :
A Replicated Study on Random Test Case Generation and Manual Unit Testing: How Many Bugs Do Professional Developers Find?
Author :
Ramler, Rudolf ; Wolfmaier, Klaus ; Kopetzky, Theodorich
Author_Institution :
Software Competence Center Hagenberg GmbH, Hagenberg, Austria
fYear :
2013
fDate :
22-26 July 2013
Firstpage :
484
Lastpage :
491
Abstract :
This paper describes the replication of an empirical study comparing tool-supported test case generation and manual development of unit tests. As variation to the original study, which was based on test results from students performing manual unit testing for 60 minutes, the replication involves professional software developers with several years of industry experience and extends the initial time restriction. As part of the replication the paper explores the differences in unit testing by students and professionals and investigates the impact of the extended time limit. The main findings are: There are no significant differences in the results produced by students and by professional developers when performing manual unit testing for 60 minutes. Furthermore, there is a non-linear increase in the number of defects found when the time limit is extended from one to two hours, which indicates the transition from the initial ramp-up phase to productive testing. The replication also confirms the conclusions of the original study: Automated test case generation can be equally efficient as manual unit testing under severe time restrictions and it may be used to complement a manual testing approach.
Keywords :
program testing; software engineering; automated test case generation; initial ramp-up phase; manual unit testing; productive testing; professional software developers; random test case generation; Conferences; Context; Industries; Java; Software; Software engineering; Testing; replication; students versus professionals; test case generation; unit teseting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Software and Applications Conference (COMPSAC), 2013 IEEE 37th Annual
Conference_Location :
Kyoto
Type :
conf
DOI :
10.1109/COMPSAC.2013.82
Filename :
6649872
Link To Document :
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