DocumentCode :
1976467
Title :
On-chip PDN design effects on 3D stacked on-chip PDN impedance based on TSV interconnection
Author :
Pak, Jun So ; Kim, Joohee ; Cho, Jonghyun ; Lee, Junho ; Lee, Hyungdong ; Park, Kunwoo ; Kim, Joungho
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear :
2010
fDate :
7-9 Dec. 2010
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents the analyses of 3D (3 Dimensional) stacked on-chip PDN (Power Distribution Network) impedances, which are composed with on-chip PDNs and TSV (Through Silicon Via) interconnections, and show the various features depending on on-chip PDN designs and 3D stacked chip configurations. Multi-stacked on-chip PDNs with very large capacitances interacting with even very small inductive TSV interconnections induces high PDN impedance peaks in GHz range, where single chip-PDN shows low PDN impedance. As multi-stacked on-chip PDN has larger capacitance, the high PDN impedance peaks appear at lower frequency range due to the relation of on-chip PDN capacitance and TSV inductance. Therefore, analysis and evaluation of on-chip PDN are very important to design 3D stacked chip. First, PDN impedance of single meshed type on-chip PDN is evaluated by the proposed on-chip PDN model and the measurement. Second, by using the evaluated on-chip PDN impedances and simple inductor model of TSV, the PDN impedances of 3D stacked on-chip PDNs is analyzed in consideration with the various on-chip PDN designs and stacked on-chip PDN numbers.
Keywords :
capacitance; distribution networks; elemental semiconductors; integrated circuit interconnections; silicon; 3D stacked chip configurations; 3D stacked on-chip PDN impedance; PDN impedance; Si; TSV interconnection; multistacked on-chip PDN; on-chip PDN design effects; power distribution network; single chip-PDN; stacked on-chip PDN numbers; through silicon via interconnections; Capacitance; Impedance; Inductance; Metals; System-on-a-chip; Three dimensional displays; Through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), 2010 IEEE
Conference_Location :
Singapore
ISSN :
2151-1225
Print_ISBN :
978-1-4244-9068-4
Electronic_ISBN :
2151-1225
Type :
conf
DOI :
10.1109/EDAPS.2010.5682994
Filename :
5682994
Link To Document :
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