• DocumentCode
    1976658
  • Title

    Augmented EPA with augmented EFIE method for packaging analysis

  • Author

    Ma, Zuhui ; Jiang, Lijun ; Chew, Wengcho ; Li, Maokun ; Qian, Zhiguo

  • Author_Institution
    Dept. Of Electr. & Electron. Eng., Univ. of Hong Kong, Pokfulam, China
  • fYear
    2010
  • fDate
    7-9 Dec. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    It is evident that the low frequency full wave electromagnetic modelling is necessary for IC packaging analysis. Considering the complexity, it is very difficult to solve the whole problem directly. Even though the domain decomposition method is a legitimate approach for these types of problems, the domain decomposition method based on the equivalence principle has the low frequency breakdown issue. In this paper, we developed a low frequency augmented equivalence principle algorithm (AEPA) with the augmented electric field integral equation (AEFIE) for packaging and IC analysis. On the equivalence surfaces, not only the electric current and the magnetic current, but also the electric charge and the magnetic charge are used to capture the low frequency couplings. Inside each AEPA box, AEFIE is applied to maintain the low frequency accuracy. As a result, we are able to solve low frequency domain decomposition problems and apply it to IC packaging analysis.
  • Keywords
    electric field integral equations; electromagnetic coupling; integrated circuit packaging; IC packaging analysis; augmented EFIE method; augmented EPA method; augmented electric field integral equation; domain decomposition method; low frequency augmented equivalence principle algorithm; low frequency breakdown; low frequency coupling; low frequency full wave electromagnetic modelling; Electric breakdown; Integral equations; Integrated circuit modeling; Magnetic domains; Mathematical model; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), 2010 IEEE
  • Conference_Location
    Singapore
  • ISSN
    2151-1225
  • Print_ISBN
    978-1-4244-9068-4
  • Electronic_ISBN
    2151-1225
  • Type

    conf

  • DOI
    10.1109/EDAPS.2010.5683002
  • Filename
    5683002