• DocumentCode
    1976963
  • Title

    Computer-Aided Simultaneous Determination of Noise and Gain Parameters of Microwave Transistors

  • Author

    Sannino, Mario

  • Author_Institution
    Istituto di Elettrotecnica ed Elettronica, UniversitÃ\xa0 di Palermo, viale del le Scienze, 90128 - Palermo, Italy.
  • fYear
    1979
  • fDate
    17-20 Sept. 1979
  • Firstpage
    692
  • Lastpage
    696
  • Abstract
    A new method for the determination of noise and gain parameters of microwave linear two-ports (transistors) is presented. The method allows the simultaneous determination of the two parameter sets through a proper computer-aided procedure which processes the experimental data obtained from a measuring system employing noise meters and generators only. Experimental verifications carried-out on a microwave low noise transistor in S-band are reported.
  • Keywords
    Acoustic reflection; Gain measurement; Microwave transistors; Noise figure; Noise generators; Noise measurement; Noise reduction; Power measurement; Tellurium; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1979. 9th European
  • Conference_Location
    Brighton, UK
  • Type

    conf

  • DOI
    10.1109/EUMA.1979.332661
  • Filename
    4131435
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1976963