• DocumentCode
    1977111
  • Title

    Area-I/O RDL routing for chip-package codesign considering regional assignment

  • Author

    Lin, Kun-Sheng ; Hsu, Hsin-Wu ; Lee, Ren-jie ; Chen, Hung-Ming

  • Author_Institution
    Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    7-9 Dec. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Flip-Chip package provides high density I/Os and better performance in package size, signal/power integrity, and wirelength. Routing on its Re-Distribution Layer (RDL) is one of the most difficult stage in Flip-Chip packaging due to the increasing number of I/Os in modern VLSI designs. Area I/O can shorten the signal path and further increases the I/O density, but the design complexity is also higher. The Area I/O RDL routing problem is introduced in this paper, considering wirelength minimization and chip-package codesign. The proposed algorithm effectively solves the problem. 100% routability is guaranteed, from block ports to I/O pads and from I/O pads to bump pads. The authors propose the concept of regional assignment to evaluate the skew between bumps and balls. It leads the nets to route within neighbor sectors rather than the opposite sector. The experimental results, on 7 industrial designs, show that the router greatly minimizes bump-ball skew compared with [12], with reasonable extra wirelength.
  • Keywords
    VLSI; flip-chip devices; integrated circuit design; integrated circuit packaging; VLSI designs; area-I/O RDL routing pproblem; bump-ball skew; chip-package codesign; flip-chip package; redistribution layer; regional assignment; signal path; wirelength minimization; Algorithm design and analysis; Arrays; Cost function; Packaging; Routing; Tiles; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), 2010 IEEE
  • Conference_Location
    Singapore
  • ISSN
    2151-1225
  • Print_ISBN
    978-1-4244-9068-4
  • Electronic_ISBN
    2151-1225
  • Type

    conf

  • DOI
    10.1109/EDAPS.2010.5683021
  • Filename
    5683021