Title :
Near-field to far-field prediction for high-speed board using an empirical approach
Author :
Oswal, Manish ; See, Kye-Yak ; Soh, Weishan ; Chang, Weng Yew ; Wang, Lin Biao ; Koh, Wee Jin ; Low, Hazel
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
This paper describes a methodology to predict far-field (FF) emissions from a high-speed board based on the fields measured in the near-field (NF) region. The NF to FF transformation is based upon an empirical relationship between the measured fields in both the NF and FF regions. Initial results show that the predicted FF emissions from a high-speed board provide the designer a good confidence on the compliance of regulatory emission limits.
Keywords :
electromagnetic compatibility; printed circuit design; printed circuits; far-field emissions; high-speed board; near-field region; regulatory emission limits; Electromagnetic compatibility; Frequency measurement; Magnetic field measurement; Magnetic fields; Noise measurement; Transfer functions; Upper bound; emission; far field; near field; prediction;
Conference_Titel :
Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), 2010 IEEE
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-9068-4
Electronic_ISBN :
2151-1225
DOI :
10.1109/EDAPS.2010.5683026