DocumentCode :
1977198
Title :
Near-field to far-field prediction for high-speed board using an empirical approach
Author :
Oswal, Manish ; See, Kye-Yak ; Soh, Weishan ; Chang, Weng Yew ; Wang, Lin Biao ; Koh, Wee Jin ; Low, Hazel
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2010
fDate :
7-9 Dec. 2010
Firstpage :
1
Lastpage :
4
Abstract :
This paper describes a methodology to predict far-field (FF) emissions from a high-speed board based on the fields measured in the near-field (NF) region. The NF to FF transformation is based upon an empirical relationship between the measured fields in both the NF and FF regions. Initial results show that the predicted FF emissions from a high-speed board provide the designer a good confidence on the compliance of regulatory emission limits.
Keywords :
electromagnetic compatibility; printed circuit design; printed circuits; far-field emissions; high-speed board; near-field region; regulatory emission limits; Electromagnetic compatibility; Frequency measurement; Magnetic field measurement; Magnetic fields; Noise measurement; Transfer functions; Upper bound; emission; far field; near field; prediction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), 2010 IEEE
Conference_Location :
Singapore
ISSN :
2151-1225
Print_ISBN :
978-1-4244-9068-4
Electronic_ISBN :
2151-1225
Type :
conf
DOI :
10.1109/EDAPS.2010.5683026
Filename :
5683026
Link To Document :
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