Title :
Origins of electromagnetic immunity holes of microcontrollers
Author :
Su, Tao ; Steinecke, Thomas ; Unger, Markus
Author_Institution :
Center for the ASIC Design, Sun Yat-sen Univ., Guangzhou, China
Abstract :
This paper describes the origins of one kind of the degradation of the electromagnetic immunity of microcontrollers. That immunity degradation is strongly frequency dependent. They appear like holes in immunity-frequency curve. Mechanism based on resonance in two types of current loops is introduced to explain the formation of those immunity holes. Measurement results are given to support the introduced theory.
Keywords :
electromagnetic interference; microcontrollers; electromagnetic immunity holes; frequency dependent; immunity degradation; immunity-frequency curve; microcontrollers; Capacitors; Integrated circuit modeling; Microcontrollers; Oscillators; Pins; Predictive models; Resonant frequency;
Conference_Titel :
Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), 2010 IEEE
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-9068-4
Electronic_ISBN :
2151-1225
DOI :
10.1109/EDAPS.2010.5683027
